Valvular & structural heart diseaseCohort study
Interventricular septal thickness on cardiac computed tomography as a novel risk factor for conduction disturbances in patients undergoing transcatheter aortic valve replacement
- Cohort study
Authors' conclusion
Pre-procedural CT assessment of basal IVS thickness is a novel predictive marker for the risk of conduction disturbances following TAVR.
Study context
- Population
- Patients with severe AS who underwent computed tomography (CT) before transcatheter aortic valve replacement (TAVR)
- Participants
- 78 patients
- Exposure
- Patients with vs without conduction disturbances after TAVR
- Conduction disturbancesn = 24
- Outcome
- Composite of conduction disturbance after TAVR
Main finding
Conduction disturbance after TAVR
Adjusted odds ratio
7.387
95% CI 2.003–27.244
P = 0.003
IVS <4 mm at 2 mm below MS vs No conduction disturbances
adjusted OR 7.387 (95% CI 2.003–27.244); P = 0.003
As reported in the abstract
- Conduction disturbances occurred in 24 of 78 patients
- 30.8%
Observational data: associations, not effects.
Further findings
Muscular interventricular septum (IVS) thickness on CT, by level below the membranous septum (MS) · pre-procedural
- 1 mm below MS: conduction disturbances vs none
- 2.98 ± 0.52 mm vs. 3.38 ± 0.52 mm
- 2 mm below MS: conduction disturbances vs none
- 4.10 ± 1.02 mm vs. 4.65 ± 0.78 mm
- 5 mm below MS: conduction disturbances vs none
- 6.11 ± 1.12 mm vs. 6.88 ± 1.03 mm
- 10 mm below MS: conduction disturbances vs none
- 9.72 ± 1.95 mm vs. 10.70 ± 1.55 mm
- P < 0.05 for all
Original publication
Interventricular septal thickness on cardiac computed tomography as a novel risk factor for conduction disturbances in patients undergoing transcatheter aortic valve replacement. Europace. Published 1 May 2024. doi:10.1093/europace/euae113
Summarised from the published abstract; every number is checked against it