Arrhythmias & electrophysiology
Device-related complications in a national pediatric cardiac implantable electronic device cohort stratified after age and implantation technique
Authors' conclusion
Transvenous implantation in children <1 year and epicardial implantation in children 9-15 years was associated with higher risk of CIED-related complication leading to reintervention, whereas for children aged 1-8 years, the complication risk was similar between implantation techniques.
Study context
- Population
- All Danish children aged ≤15 years receiving a de novo CIED from 1977 to 2021median [interquartile range] follow-up of 14 [6–21] years, median age 6 [1–11] years
- Participants
- 376 children
- Exposure
- Risks and causes of reintervention between transvenous and epicardial CIED recipients, stratified by age
- Transvenousn = 245 [65%]
- Epicardialn = 131 [35%]
- Outcome
- Complication-driven reintervention across age groups, epicardial recipients
Main finding
As reported in the abstract
- Equal across age groups
- P = .10
Observational data: associations, not effects.
Further findings
Complication-driven reintervention across age groups, transvenous recipients
- Risk significantly lower with increasing age
- P < 0.001
Age-specific risk of complication-driven reintervention (<1 year, 1-8 years, 9-15 years)
- Different risks for children aged <1 year, 1-8 years, and 9-15 years
- Pinteraction <.001
Complication-driven reintervention, children <1 year
- More frequent for transvenous vs epicardial recipients
- P < 0.001
Complication-driven reintervention, children aged 9-15 years
- The opposite observed (more frequent for epicardial vs transvenous recipients)
- P = 0.02
Original publication
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